We are performing RF and rssi testing on the DA14585 chipset using SDK 6.0.2. We are using DA 14585 daughter board connected to the DA 14580 PRO development board. The Dialog board connected to one channel of the attenuator, advertises packets every one second, and the same were captured by a scanning device connected to second channel of the attenuator. The attenuation provided was gradually increased in steps of 10dB, and was varied from 10dB - 100dB. On analysis of the rssi of the packets captured, it was observed that, for each case(10dB - 100 dB loss), rssi values received varied drastically. For instance, when the PRO board was powered through CR2032 coin cell battery, for an attenuation loss of 50dB, the rssi values obtained were not constant, and fluctuated between the range 48dBm - 70dBm (HEX), which corresponds to a range of 40dBm(in decimal). This wide fluctuation was observed for all the attenuation test cases. Please suggest the possible reasons for the same. Also, please explain how accurate the rssi values of the dialog device are.